000 | 03144nam a22002777a 4500 | ||
---|---|---|---|
999 |
_c11176 _d11176 |
||
003 | PK-SiUMT | ||
005 | 20220914125521.0 | ||
008 | 220525b ||||| |||| 00| 0 eng d | ||
020 | _a9783527335619 (pbk.) | ||
020 | _a9783527681143 (ePDF) | ||
020 | _a9783527681181 (ePub) | ||
020 | _a9783527681174 (Mobi) | ||
040 | _cPK-SiUMT | ||
082 | 0 | 4 |
_a548.83 _223 |
100 | 1 |
_aZolotoyabko, Emil, _eauthor. _94398 |
|
245 | 1 | 0 |
_aBasic concepts of X-ray diffraction / _cEmil Zolotoyabko. |
260 |
_aWeinheim, Germany : _bWiley-VCH, _cc2014. |
||
300 |
_axii, 297 pages : _billustration. (some colors.), _c25 cm. |
||
504 | _aIncludes bibliographical references (p. 285-290) and index. | ||
505 | 0 | _aPreface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index. | |
520 | _a"Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental lawss that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications..."-- Back cover. | ||
650 | 0 |
_aX-rays - XRD _xDiffraction. _94399 |
|
650 | 0 |
_aChemistry - XR-D - XRD _94400 |
|
856 |
_3e-Books Basic concepts of X-ray diffraction / _dhttps://pk1lib.org/book/2696642/cdd45f _klrcskt _llrc.umt _mnadeem.sohail@skt.umt.edu.pk _qe-Book _uhttps://pk1lib.org/book/2696642/cdd45f _zClick here to access full text book |
||
942 |
_2ddc _cBK |