Normal view
MARC view
- Spectrum analysis
Entry Topical Term
001 - CONTROL NUMBER
- control field: 4449
003 - CONTROL NUMBER IDENTIFIER
- control field: PK-SiUMT
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20220526122352.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 220526|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: PK-SiUMT
- Transcribing agency: PK-SiUMT
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Spectrum analysis
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (PK-SiUMT)0: Egerton, R.F. 4446, Physical Principles of Electron Microscopy, 2016.