| 000 -LEADER |
|---|
| fixed length control field |
02622nam a22003137a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
PK-SiUMT |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20220801161740.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
220526b ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783319398761 (print) |
| 024 7# - OTHER STANDARD IDENTIFIER |
|---|
| Standard number or code |
10.1007/978-3-319-39877-8 |
| Source of number or code |
doi |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
PK-SiUMT |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
543.5 |
| Item number |
EGE-P |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Egerton, R.F. |
| 9 (RLIN) |
4446 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Physical Principles of Electron Microscopy: |
| Remainder of title |
an Introduction to TEM, SEM, and AEM / |
| Statement of responsibility, etc. |
by R.F. Egerton. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. 2016. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Cham : |
| Name of publisher, distributor, etc. |
Springer International Publishing : |
| -- |
Imprint: Springer, |
| Date of publication, distribution, etc. |
2016. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XI, 196 pages 124 illustrations., 15 illustrations. in color. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations. |
| 506 ## - RESTRICTIONS ON ACCESS NOTE |
|---|
| Terms governing access |
Available on campus and off campus with authorized login. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials science. |
| 9 (RLIN) |
4058 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Biochemistry |
| 9 (RLIN) |
4447 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Microscopy. |
| 9 (RLIN) |
4448 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Spectrum analysis |
| 9 (RLIN) |
4449 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Nanotechnology. |
| 9 (RLIN) |
4450 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron Microscopy |
| 9 (RLIN) |
4451 |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9783319398761 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Koha item type |
Books |
