| 000 -LEADER |
|---|
| fixed length control field |
03144nam a22002777a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
PK-SiUMT |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20220914125521.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
220525b ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527335619 (pbk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527681143 (ePDF) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527681181 (ePub) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527681174 (Mobi) |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
PK-SiUMT |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
548.83 |
| Edition number |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Zolotoyabko, Emil, |
| Relator term |
author. |
| 9 (RLIN) |
4398 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Basic concepts of X-ray diffraction / |
| Statement of responsibility, etc. |
Emil Zolotoyabko. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Weinheim, Germany : |
| Name of publisher, distributor, etc. |
Wiley-VCH, |
| Date of publication, distribution, etc. |
c2014. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xii, 297 pages : |
| Other physical details |
illustration. (some colors.), |
| Dimensions |
25 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references (p. 285-290) and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Preface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
"Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental lawss that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications..."-- Back cover. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
X-rays - XRD |
| General subdivision |
Diffraction. |
| 9 (RLIN) |
4399 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Chemistry - XR-D - XRD |
| 9 (RLIN) |
4400 |
| 856 ## - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
e-Books Basic concepts of X-ray diffraction / |
| Path |
https://pk1lib.org/book/2696642/cdd45f |
| Password |
lrcskt |
| Logon |
lrc.umt |
| Contact for access assistance |
nadeem.sohail@skt.umt.edu.pk |
| Electronic format type |
e-Book |
| Uniform Resource Identifier |
https://pk1lib.org/book/2696642/cdd45f |
| Public note |
Click here to access full text book |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Koha item type |
Books |
