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Design-for-test for digital IC's and embedded core systems /

by Crouch, Alfred L.
Published by : Pearson Educaion, (New Delhi :) Physical details: xxvii, 349 p. : ill. ; 25 cm. ISBN:0130848271. Year: 2008
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Item type Current location Call number Status Date due Barcode
Books Books Hall D
621.3815 CRD (Browse shelf) Available 93188

Includes bibliographical references and index.

System requirements for accompanying computer disc: UNIX ; Microsoft Windows.

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